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dc.creatorMera C.spa
dc.creatorOrozco-Alzate M.spa
dc.creatorBranch J.spa
dc.creatorMery D.spa
dc.date.accessioned2017-05-12T16:05:54Z
dc.date.available2017-05-12T16:05:54Z
dc.date.created2016
dc.identifier.issn1663615
dc.identifier.urihttp://hdl.handle.net/11407/3141
dc.description.abstractOne of the industrial applications of computer vision is automatic visual inspection. In the last decade, standard supervised learning methods have been used to detect defects in different kind of products. These methods are trained with a set of images where every image has to be manually segmented and labeled by experts in the application domain. These manual segmentations require a large amount of high quality delineations (on pixels), which can be time consuming and often a difficult task. Multi-instance learning (MIL), in contrast to standard supervised classifiers, avoids this task and can, therefore, be trained with weakly labeled images. In this paper, we propose an approach for the automatic visual inspection that uses MIL for defect detection. The approach has been tested with data from three artificial benchmark datasets and three real-world industrial scenarios: inspection of artificial teeth, weld defect detection and fishbone detection. Results show that the proposed approach can be used with weakly labeled images for defect detection on automatic visual inspection systems. This approach is able to increase the area under the receiver-operating characteristic curve (AUC) up to 6.3% compared with the naïve MIL approach of propagating the bag labels. © 2016 Elsevier B.V.eng
dc.language.isoeng
dc.publisherElsevier B.V.spa
dc.relation.isversionofhttp://www.sciencedirect.com/science/article/pii/S0166361516301750spa
dc.sourceScopusspa
dc.subjectAutomatic visual inspectionspa
dc.subjectDefect detectionspa
dc.subjectMulti-instance learningspa
dc.subjectPattern recognitionspa
dc.subjectWeak labelsspa
dc.titleAutomatic visual inspection: An approach with multi-instance learningspa
dc.typeArticleeng
dc.rights.accessrightsinfo:eu-repo/semantics/restrictedAccess
dc.rights.accessrightsinfo:eu-repo/semantics/restrictedAccess
dc.contributor.affiliationMera, C., Universidad Nacional de Colombia, Sede Medellín, Departamento de Ciencias de la Computación y de la Decisión, Cra. 80 # 65-223, Medellín, Colombia, Universidad de Medellín, Facultad de Ingeniería, Carrera 87 # 30-65, Medellín, Colombiaspa
dc.contributor.affiliationOrozco-Alzate, M., Universidad Nacional de Colombia, Sede Manizales, Departamento de Informática y Computación, km 7 vía al Magdalena, Manizales, Colombiaspa
dc.contributor.affiliationBranch, J., Universidad Nacional de Colombia, Sede Medellín, Departamento de Ciencias de la Computación y de la Decisión, Cra. 80 # 65-223, Medellín, Colombiaspa
dc.contributor.affiliationMery, D., Pontificia Universidad Católica de Chile, Departamento de Ciencias de la Computación, Av. Vicuña Mackenna 4860, Santiago de Chile, Chilespa
dc.identifier.doi10.1016/j.compind.2016.09.002
dc.subject.keywordComputer visioneng
dc.subject.keywordInspectioneng
dc.subject.keywordPattern recognitioneng
dc.subject.keywordAutomatic visual inspectioneng
dc.subject.keywordAutomatic visual inspection systemseng
dc.subject.keywordDefect detectioneng
dc.subject.keywordMulti-instance learningeng
dc.subject.keywordReceiver operating characteristic curveseng
dc.subject.keywordSupervised classifierseng
dc.subject.keywordSupervised learning methodseng
dc.subject.keywordWeak labelseng
dc.subject.keywordDefectseng
dc.relation.ispartofesComputers in Industryspa
dc.type.driverinfo:eu-repo/semantics/article


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